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Device Under Test

a specific purpose component or module check; ex. substantial component of a PCB.

See Also: DUT, Unit Under Test, EUT


Showing results: 256 - 270 of 317 items found.

  • Power Quality Analyzer

    PQM-711 - Sonel S.A.

    PQM-711 power quality analyzer is an advanced product for wide type of measurements, analysis and recording of network parameters 50/60 Hz and the power quality diagnostic according to European standard EN 50160. PQM-711 is an innovative model with a wireless communication Wi-Fi , which allows for automatic pairing with the included tablet, with a large 10" touch screen. Tablet allows full operating of the analyzer, live data preview and the reading and analysis of data stored in the internal memory. With this solution, the PQM-711 is an unique device that combines the advantages of the analyzer with built-in display and typical portable analyzers (known as Black Boxes).With the tablet you can very fast checked the device under test. On the other hand, you can leave the analyzer module for multi-measurements as a typical logger without display. You can very fast diagnose the machine under test using the tablet. On the other hand, you can leave the analyzer module itself for many days measurement as a typical logger without display. PQM-711 has a transient registration with a maximum sampling rate of 10 MHz (rapid changes in voltage) and control signals. The minimum duration of the registered transient is 650 ns.

  • Pneumatic Test Pump Kit

    700HPPK - Fluke Calibration

    The Fluke Calibration 700HPPK Pneumatic Test Pump Kit generates and adjusts pneumatic pressures up to 21 MPa (3000 psi), without requiring a nitrogen bottle or other external pressure supply. It supplies pressure to devices under test (DUTs) that include transmitters, controllers, pilots, digital and analog gauges, and more. It’s the perfect solution for generating high pressure in the field, where conditions and operating surfaces can vary. The 700HPPK is the ideal choice for calibration technicians, test engineers, and instrument technicians working in industries like natural gas transmission and distribution, process, aerospace and defense, who need a simple-to-use, safe and portable pressure source that they can depend on in a wide variety of conditions.

  • Modulation Distortion Up To 53 GHz

    S95070B - Keysight Technologies

    S95070B software enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 53 GHz. The wide dynamic range and vector error correction of the PXI VNA results in an extremely low residual EVM from the test setup, giving you a complete picture of your device’s performance without test system interference. S95070B software measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals through spectral correlation between the input and output spectrum, without doing demodulation. Integration with the PXI VNA’s measurement flexibility enables you to do quick modulation distortion measurements along with traditional VNA tests.

  • CMX RF Port Extender

    CMX-Z25 - Rohde & Schwarz GmbH & Co. KG

    Complex devices under test (DUT) come with additional antenna ports to support low, mid and high bands - and advanced MIMO schemes such as 4x4 MIMO. The R&S®CMX-Z25 is the solution: Up to 16 DUT ports can be supported with just 4 ports from R&S®CMX500. So even prototypes of 5G smartphones, tablets, laptops or industrial modules with an extended number of antenna ports can now be connected to a single R&S®CMX500. Together with the scalable CMX architecture any 5G and 5G Advanced mobile device can now be tested in one go - without recabling or 3GPP band combo limitations.

  • 4-Quadrant General-Purpose Source/Measure Unit, ±20 V, ±1 A Or ±6 V, ±3 A, 20 W

    N6784A - Keysight Technologies

    The Keysight N6784A is a source/measure unit (SMU) designed for general-purpose precision sourcing and measurement. General-purpose applications can span many different industries and many different devices under test (DUTs). The N6784A SMU is a versatile tool designed to tackle many of these general-purpose applications. Its glitch-free operation ensures safe usage with the DUT during output and measurement range changes, even with capacitances of up to 150 µF. Its 4-quadrant operation enables it to act as a bipolar power supply or a bipolar electronic load, for added versatility. When using the N6784A SMU, engineers can be confident that they have an all-around general-purpose tool for their test systems or lab bench.

  • Modulation Distortion Up To 90 GHz

    S930709B - Keysight Technologies

    S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To 125 GHz

    S930712B - Keysight Technologies

    S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Large-size Hybrid Reverberation / Anechoic Chamber

    F-Series - Emite Ingeniería SL. Ed

    The F large-size hybrid Reverberation/Anechoic Chamber represents the most versatile OTA test system in the market today. With the same unique test features of their E Series RC counterparts, the F-Series can also test large form-factor devices under test (DUTs) like laptops, large TV sets, solar and trash compactors, drones, fridges or washing and vending machines, among others. With up to 16x16, 8DLCC and DUTs up to 2m and 500 kg including full-body phantoms in a turntable, the F Series also expands the frequency range down to cover 200 MHz up to 40 GHz frequency ranges and the test modes to include EMC, BS, small cell, eNodeB and Virtual Drive Testing over the air (VDT-OTA). In an again unheard-of feature, the F-Series is also reverse-convertible into an Anechoic chamber, allowing Far Field (FF) and Spherical Near Field (SNF) radiation patterns, efficiency and gain measurements and pre-5G testing of antennas and devices. Conversion from RC to AC or vice versa can be performed within half a day.

  • Power Profiler, DC Energy Analyzer, Power Supply, Digital Multimeter, Source Measure Unit, Power Debugger

    Otii Ace Pro - Qoitech AB

    Otii Ace Pro is the big brother to Otii Arc, and is an instrument that can precisely source voltage (up to 25 V) and current (up to 5A) and simultaneously measures voltage and/or current with a high sample rate (50ksps) and low step size. It computes power and energy and enables engineers and developers to easily see and optimize the energy consumption and battery life of their devices under test.

  • Breakdown Voltage Tester

    ZDS-50B - Shanghai Dean Electrical Co., Ltd

    Executive standard: GB/T4074.5-2008/IEC60851-4; Inspection standard: JB/T4279.11-2008Used to test the breakdown voltage performance under room temperature of enameled round and flat wires with nominal conductor diameter of 0.018mm and above;Three voltage rise speeds are available: 20V/s, 100V/s and 500V/s, with error being ±5%;Three test methods can be adopted: round bar method, twist pair method and ball method;Clamp a group of test samples (5 for each) once, available to complete breakdown or withstand voltage test for any of sample one by one or individually; breakdown voltage and withstand voltage time would be automatically saved for future enquiry; all operations would be automatically completed;Capable of conducting high temperature breakdown voltage test in combination with RDS-50 thermal-state voltage tester;LED would automatically display test results and automatically return;During sample breakdown, breakdown voltage indication value would be automatically locked, free from flashing, and the test result is distinct and relatively clear;Equipped with test fixture for round rod method and twist pair method as well as the test weight for round rod method;Equipped with ball method test device (steel balls are prepared by user);Test door is provided with safety interlocking device, compliant with relevant regulations on high voltage testing equipment.

  • 2-Module ICT System, I317x Series 6

    E9902G - Keysight Technologies

    Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.

  • Board Stress Analysis

    Arcadia Test

    Board stress analysis is an increasingly critical part of the test fixture build process today. Probe densities under BGA devices put tremendous pressure onto the solder joints of these devices. If the fixture is not designed properly, immediate damage can occur to the BGA’s, or even more devastating, future damage, which creates field failures. We can provide strain testing before shipping your fixture to insure that there are not excessive forces placed on your BGA parts. With the use of National Instruments Strain equipment, and tri-directional rosettes, we cycle test the board/fixture and measure and record the amount of strain from each corner of each BGA. Any over limit conditions are corrected before shipment. This service insures that your products will not be damaged at ICT, and help to reduce field failures from damaged components, compromised solder joints, or lifted pads.

  • vibration test system

    Labtone Test Equipment Co., LTD

    Labtone EV series of electrodynamic shaker vibration test System simulate the vibration environment under the laboratory condition, and test the impact strength as well as reliability of various vibration test applications.Labtone EV series of electromagnetic vibration testing system simulate the vibration environment under the laboratory condition, and test the impact strength as well as reliability of various vibration test applications. In the laboratory, with the aid of vibration testing system, simulations of reproduction of sinusoidal, random, resonant search and dwell, classical shock and road models, etc. can be achieved. It is essential for product quality assurance, new product research and development.Labtone EV series of electromagnetic vibration testing system is specially designed to meet the need for long time operation. Vertical and horizontal vibrations can be achieved by the installation of vibration resistant base. The standard platform is equipped with high efficiency airbag shock isolation device, so that the vibration transmitted to the building can be minimized. There is no need for additional foundation in most of the cases.A complete set of vibration testing system is composed of shaker, power amplifier and vibration measuring control system, in accordance with the relevant national and international standards (such as: MIL-STD, DIN, ISO, ASTM, IEC, ISTA, GB, GJB, JIS, BS, etc.) to provide technical support for establishing product quality inspection.

  • Regenerative AC Load

    61800 - Chroma ATE Inc.

    Chroma Power Electronics Test Solutions not only apply in the industries of Information Technology, Communication, Aerospace and National Defense, but also in energy efficient products such as Hybrid Automobiles, LED luminance devices, solar and fuel cells that are developed aggressively under the pressure of natural resource constraints. Chroma has a wide variety of instrumentation including AC Power Sources, DC Power Supplies, DC Electronic Loads, AC Electronic Loads, Digital Power Meters, and Automatic Test Systems that are ideal for power input/output terminal tests and dynamic simulation.

  • Power Electronics Test Solutions

    Chroma ATE Inc.

    Chroma Power Electronics Test Solutions not only apply in the industries of Information Technology, Communication, Aerospace and National Defense, but also in energy efficient products such as Hybrid Automobiles, LED luminance devices, solar and fuel cells that are developed aggressively under the pressure of natural resource constraints. Chroma has a wide variety of instrumentation including AC Power Sources, DC Power Supplies, DC Electronic Loads, AC Electronic Loads, Digital Power Meters, and Automatic Test Systems that are ideal for power input/output terminal tests and dynamic simulation.

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